Quantitative analysis of valence electron energy-loss spectra of aluminium nitride.
نویسندگان
چکیده
The optical properties and electronic structure of aluminium nitride are determined using valence electron energy-loss spectroscopy in a dedicated scanning transmission electron microscope. Quantitative analysis of the experimental valence electron energy-loss spectra to determine the electronic structure encompasses single scattering deconvolution of the valence electron energy-loss spectra to calculate the energy-loss function, Kramers-Kronig analysis of the energy-loss function to reveal the complex dielectric function, transformation of the dielectric function into the optical interband transition strength via optical property relations and finally critical-point analysis of the interband transition strength. The influence of both experimental and analytical parameters on the final result was studied systematically to define and improve the understanding of the methods. To check the reliability of this technique the interband transition strength determined was compared with results of vacuum ultraviolet spectroscopy. Good agreement was found if sample preparation was taken into account. The preparation of the specimen for the transmission electron microscopy has an effect on the electronic structure. Quantitative analysis of valence electron energy-loss spectroscopy, using the methods presented, is an important and capable method to determine the electronic structure of materials and it has the benefit of high spatial resolution.
منابع مشابه
Critical point analysis of the interband transition strength of electrons
Optical and electron-energy-loss spectroscopies are well established methods of probing the electronic structure of materials. Comparison of experimental spectroscopic results with theory is complicated by the fact that the experiments extract information about the interband transition strength of electrons, whereas theoretical calculations provide information about individual valence and condu...
متن کاملSTUDY ON CORROSION PROPERTIES OF PLASMA NITRIDED PURE ALUMINIUM
Abstract: In this research plasma nitriding of pure aluminium and effect of iron elemental alloy on the formation and growth of aluminium nitride was investigated. Also corrosion properties of formed AlN were investigated. After preparation, the samples were plasma nitrided at 550oC, for 6, 9 and 12 h and a gas mixture of 25%H2-75%N2. The microstructure and phases analysis were investigated usi...
متن کاملX - Ray Photoelectron Spectroscopy Study of the Dfierence between Reactively Evaporated
X-ray photoelectron spectroscopy (XPS) technique has been used to study carefully prepared oxide-free titanium nitride (TiN) films of nearly identicd stoichiometry, grown by direct sputtering and reactive evaporation. The lineshapes and pe~ positions of the Ti 2p and N 1s transitions are dependent upon the deposition method. The XPS results showed that oxynitrides me present following exposure ...
متن کاملN-K ELNES study of anisotropy effects in hexagonal AlN.
Anisotropic effects in hexagonal aluminium nitride have been studied by electron energy-loss spectroscopy (EELS) in the N-K energy loss near edge structure (ELNES). Experimental data acquired with different collection angles and with a nearly parallel incident electron beam aligned along the c-axis have been compared to simulations based on ab initio calculations. The extraction of intrinsic pa...
متن کاملS ' L core edge fine structure in an oxidation serijes of smcon compounds : A comparison of microelectron energy ~ oss spectra with theory
Transmission electron energy loss spectra were obtained from small (approximately loo-A diam) regions of a series of single-phase silicon-containing specimens at loo-keV incident beam energy, using a field emission source transmission electron microscope fitted with a magnetic sector spectrometer. The specimen foils were diamond cubic silicon, a-silicon carbide, a-silicon nitride, and amorphous...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید
ثبت ناماگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید
ورودعنوان ژورنال:
- Journal of microscopy
دوره 191 3 شماره
صفحات -
تاریخ انتشار 1998